Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits - researchr publication authors

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Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi. Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 145-151, IEEE Computer Society, 1998. [doi]

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