Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi. Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 145-151, IEEE Computer Society, 1998. [doi]
@inproceedings{YoonVCN98,
title = {Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits},
author = {Heebyung Yoon and Pramodchandran N. Variyam and Abhijit Chatterjee and Naveena Nagi},
year = {1998},
url = {http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360145.pdf},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/YoonVCN98},
cites = {0},
citedby = {0},
pages = {145-151},
booktitle = {16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-8436-4},
}