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An Inductive-Coupling DC Voltage Transceiver for Highly Parallel Wafer-Level Testing

Yoichi Yoshida, Koichi Nose, Yoshihiro Nakagawa, Koichiro Noguchi, Yasuhiro Morita, Masamoto Tago, Masayuki Mizuno, Tadahiro Kuroda. An Inductive-Coupling DC Voltage Transceiver for Highly Parallel Wafer-Level Testing. J. Solid-State Circuits, 45(10):2057-2065, 2010. [doi]

Authors

Yoichi Yoshida

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Koichi Nose

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Yoshihiro Nakagawa

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Koichiro Noguchi

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Yasuhiro Morita

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Masamoto Tago

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Masayuki Mizuno

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Tadahiro Kuroda

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