D. Zander, F. Saigné, A. Meinertzhagen. Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides. Microelectronics Reliability, 41(9-10):1355-1360, 2001.
@article{ZanderSM01,
title = {Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides},
author = {D. Zander and F. Saigné and A. Meinertzhagen},
year = {2001},
researchr = {https://researchr.org/publication/ZanderSM01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1355-1360},
}