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D. Zander, F. Saigné, A. Meinertzhagen. Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides. Microelectronics Reliability, 41(9-10):1355-1360, 2001.
Possibly Related PublicationsThe following publications are possibly variants of this publication: Comparison of interfaces states density through their energy distribution and LVSILC induced by uniform and localized injections in 2.3nm thick oxidesD. Zander. mr, 45(5-6):891-894, 2005. [doi]
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