Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides

D. Zander, F. Saigné, A. Meinertzhagen. Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides. Microelectronics Reliability, 41(9-10):1355-1360, 2001.

Possibly Related Publications

The following publications are possibly variants of this publication: