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Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides

D. Zander, F. Saigné, A. Meinertzhagen. Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides. Microelectronics Reliability, 41(9-10):1355-1360, 2001.

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