Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition

Ying Zhang, Li Ling, Jianhui Jiang, Jie Xiao. Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. J. Electronic Testing, 34(4):447-460, 2018. [doi]

Authors

Ying Zhang

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Li Ling

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Jianhui Jiang

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Jie Xiao

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