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Ying Zhang, Li Ling, Jianhui Jiang, Jie Xiao. Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. J. Electronic Testing, 34(4):447-460, 2018. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Exploit Dynamic Voltage and Frequency Scaling for SoC Test Scheduling under Thermal ConstraintsLi Ling, Jianhui Jiang. ats 2014: 180-185 [doi]
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