Ying Zhang, Li Ling, Jianhui Jiang, Jie Xiao. Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. J. Electronic Testing, 34(4):447-460, 2018. [doi]
@article{ZhangLJX18,
title = {Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition},
author = {Ying Zhang and Li Ling and Jianhui Jiang and Jie Xiao},
year = {2018},
doi = {10.1007/s10836-018-5733-x},
url = {https://doi.org/10.1007/s10836-018-5733-x},
researchr = {https://researchr.org/publication/ZhangLJX18},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {34},
number = {4},
pages = {447-460},
}