Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition

Ying Zhang, Li Ling, Jianhui Jiang, Jie Xiao. Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. J. Electronic Testing, 34(4):447-460, 2018. [doi]

Abstract

Abstract is missing.