A novel PUF based on cell error rate distribution of STT-RAM - researchr publication authors

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Xian Zhang, Guangyu Sun, Yaojun Zhang, Yiran Chen, Hai Li, Wujie Wen, Jia Di. A novel PUF based on cell error rate distribution of STT-RAM. In 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016, Macao, Macao, January 25-28, 2016. pages 342-347, IEEE, 2016. [doi]

This author has not been identified. Look up 'Xian Zhang' in GoogleThis author has not been identified. Look up 'Guangyu Sun' in GoogleThis author has not been identified. Look up 'Yaojun Zhang' in GoogleThis author has not been identified. Look up 'Yiran Chen' in GoogleThis author has not been identified. Look up 'Hai Li' in GoogleThis author has not been identified. Look up 'Wujie Wen' in GoogleThis author has not been identified. Look up 'Jia Di' in Google

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