Xian Zhang, Guangyu Sun, Yaojun Zhang, Yiran Chen, Hai Li, Wujie Wen, Jia Di. A novel PUF based on cell error rate distribution of STT-RAM. In 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016, Macao, Macao, January 25-28, 2016. pages 342-347, IEEE, 2016. [doi]
@inproceedings{ZhangSZCLWD16,
title = {A novel PUF based on cell error rate distribution of STT-RAM},
author = {Xian Zhang and Guangyu Sun and Yaojun Zhang and Yiran Chen and Hai Li and Wujie Wen and Jia Di},
year = {2016},
doi = {10.1109/ASPDAC.2016.7428035},
url = {http://dx.doi.org/10.1109/ASPDAC.2016.7428035},
researchr = {https://researchr.org/publication/ZhangSZCLWD16},
cites = {0},
citedby = {0},
pages = {342-347},
booktitle = {21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016, Macao, Macao, January 25-28, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9569-4},
}