A novel PUF based on cell error rate distribution of STT-RAM

Xian Zhang, Guangyu Sun, Yaojun Zhang, Yiran Chen, Hai Li, Wujie Wen, Jia Di. A novel PUF based on cell error rate distribution of STT-RAM. In 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016, Macao, Macao, January 25-28, 2016. pages 342-347, IEEE, 2016. [doi]

Abstract

Abstract is missing.