Joseph B. Bernstein - researchr alias

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Viewing Publication 1 - 19 from 19

2023

The Effects of Process Variations and BTI in Packaged FinFET DevicesEmmanuel Bender, Joseph B. Bernstein, Duane S. Boning. irps 2023: 1-5 [doi]

The Correct Hot Carrier Degradation ModelJoseph B. Bernstein, Emmanuel Bender, Alain Bensoussan 0002. irps 2023: 1-5 [doi]

2021

Microchip Health Monitoring System Using the FLL CircuitEmmanuel Bender, Joseph B. Bernstein. sensors, 21(7):2285, 2021. [doi]

2018

An improved reliability model for Si and GaN power FETGady Golan, Moshe Azoulay, Tsuriel Avraham, Ilan Kremenetsky, Joseph B. Bernstein. mr, 81:77-89, 2018. [doi]

2017

Reliability prediction with MTOLJoseph B. Bernstein, Alain Bensoussan, Emmanuel Bender. mr, 68:91-97, 2017. [doi]

2014

Reliability matrix solution to multiple mechanism predictionJoseph B. Bernstein, Moti Gabbay, Ofir Delly. mr, 54(12):2951-2955, 2014. [doi]

2011

Hardware Error Likelihood Induced by the Operation of SoftwareBing Huang, Manuel Rodriguez, Ming Li, Joseph B. Bernstein, Carol Smidts. tr, 60(3):622-639, 2011. [doi]

2009

Assessment of acceleration models used for BGA solder joint reliability studiesLiyu Yang, Joseph B. Bernstein, T. Koschmieder. mr, 49(12):1546-1554, 2009. [doi]

Failure rate estimation of known failure mechanisms of electronic packagesLiyu Yang, Joseph B. Bernstein. mr, 49(12):1563-1572, 2009. [doi]

2006

Electronic circuit reliability modelingJoseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor. mr, 46(12):1957-1979, 2006. [doi]

2005

2004

Combined Channel Segmentation and Buffer Insertion for Routability and Performance Improvement of FieldHu Huang, Joseph B. Bernstein, Martin Peckerar, Ji Luo. iccd 2004: 490-495 [doi]

A High Performance Radiation-Hard Field Programmable Analog Array Ji Luo, Joseph B. Bernstein, J. Ari Tuchman, Hu Huang, Kuan-Jung Chung, Anthony L. Wilson. isqed 2004: 522-527 [doi]

2002

Reliable Laser Programmable Gate Array TechnologyZhuo Gao, Ji Luo, Hu Huang, Wei Zhang, Joseph B. Bernstein. isqed 2002: 252-256 [doi]

1998

Laser formed connections for programmable wiringJoseph B. Bernstein, Wei Zhang, Carl H. Nicholas. cicc 1998: 163-165 [doi]

1990

Electrical characterization of polymeric insulation by electrically stimulated acoustic wave measurementsJoseph B. Bernstein. PhD thesis, Massachusetts Institute of Technology, Cambridge, MA, USA, 1990. [doi]

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