External Links

    Journal: IEEE Design & Test of Computers

    Volume 11, Issue 1

    2 -- 4. EIC Message
    5 -- 0. New Products
    7 -- 17Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan. ScanBist: A Multifrequency Scan-Based BIST Method
    18 -- 26Sungho Kang, Stephen A. Szygenda. Design Validation: Comparing Theoretical and Empirical Results of Design Error Modeling
    27 -- 38Einar J. Aas, Tore Steen, Karl Klingsheim. Quantifying Design Quality Through Design Experiments
    40 -- 52Magdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake. Analyzing Multichip Module Testing Strategies
    53 -- 59R. G. (Ben) Bennitts. Progress in Design for Test: A Personal View
    60 -- 68. A D&T Roundtable
    71 -- 72. Conference Reports
    75 -- 0. News
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