Journal: IEEE Design & Test of Computers

Volume 14, Issue 4

1 -- 0. D&T to greet new EIC
4 -- 5Victor P. Nelson. Which tester is right for your MCM?
5 -- 6. Conference Reports
7 -- 13Burton J. Smith. Burton Smith s Multithreaded Success Strategy
14 -- 0Yervant Zorian, Rajesh K. Gupta. Design and Test of Core-Based Systems on Chips
15 -- 25Rajesh K. Gupta, Yervant Zorian. Introducing Core-Based System Design
26 -- 35Ann Marie Rincon, Cory Cherichetti, James A. Monzel, David R. Stauffer, Michael T. Trick. Core Design and System-on-a-Chip Integration
36 -- 41Frank S. Eory. A Core-Based System-to-Silicon Design Methodology
42 -- 51Vijay K. Madisetti, Lan Shen. Interface Design for Core-Based Systems
52 -- 59Nur A. Touba, Bahram Pouya. Using Partial Isolation Rings to Test Core-Based Designs
60 -- 68Mika Kuulusa, Jari Nurmi, Janne Takala, Pasi Ojala, Henrik Herranen. A Flexible DSP Core for Embedded Systems
69 -- 77Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto, Enrico Macii, Massimo Poncino. Testing Core-Based Systems: A Symbolic Methodology
78 -- 86Keith A. Jenkins. Detecting and Preventing Measurement Errors
87 -- 94Al Crouch, Jeff Freeman. Designing and Verifying Embedded Microprocessors
95 -- 102. A D&T Roundtable: What s Next for Microelectronics Education?
103 -- 107. IEEE Design & Test of Computers: 1997 Annual Index, Volume 14
108 -- 109. DDATC Newsletter
110 -- 111. Tttc Newsletter
112 -- 0Lee Whetsel. A silicon El NiƱo?