Journal: IEEE Design & Test of Computers

Volume 17, Issue 2

5 -- 6Yervant Zorian. Embedded in this issue
6 -- 9. News
11 -- 13Donatella Sciuto. Guest Editor s Introduction: Design Tools for Embedded Systems
14 -- 27Marco Sgroi, Luciano Lavagno, Alberto L. Sangiovanni-Vincentelli. Formal Models for Embedded System Design
28 -- 38Frank Slomka, Matthias Dörfel, Ralf Münzenberger, Richard Hofmann. Hardware/Software Codesign and Rapid Prototyping of Embedded Systems
40 -- 50Margarida F. Jacome, Gustavo de Veciana. Design Challenges for New Application-Specific Processors
51 -- 59Michael Eisenring, Lothar Thiele, Eckart Zitzler. Conflicting Criteria in Embedded System Design
60 -- 72Alberto Allara, Massimo Bombana, William Fornaciari, Fabio Salice. A Case Study in Design Space Exploration: The Tosca Environment Applied to a Telecommunication Link Controller
74 -- 85Luca Benini, Alberto Macii, Enrico Macii, Massimo Poncino. Increasing Energy Efficiency of Embedded Systems by Application-Specific Memory Hierarchy Generation
86 -- 93Keith A. Jenkins, James P. Eckhardt. Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
94 -- 99Dilip K. Bhavsar. Synchronizing the IEEE 1149.1 Test Access Port for Chip-Level Testability
101 -- 110Janardhan H. Satyanarayana, Keshab K. Parhi. Power Estimation of Digital Data Paths Using HEAT
112 -- 119Hendrawan Soeleman, Kaushik Roy, Tan-Li Chou. Estimating Circuit Activity in Combinational CMOS Digital Circuits
120 -- 126. A D&T Roundtable: Design Automation in a Subwavelength Worl
127 -- 135. Conference Reports
136 -- 139. Panel Summaries
140 -- 0. DATC Newsletter
141 -- 0. TTTC Newsletter
142 -- 143Mukund Modi. SCC20 Reports on Recent Standards Activities
143 -- 144. In the Licensing Dungeon: CAD by the Minute