| 17 | -- | 26 | Osamu Karatsu, Tamio Hoshino, Makoto Endo, Hitoshi Kitazawa, Tohru Adachi, Kazuhiro Ueda. An Integrated Design Automation System for VLSI Circuits |
| 27 | -- | 34 | Takao Uehara. A Knowledge-Based Logic Design System |
| 35 | -- | 42 | Kiyoshi Enomoto, Shunichiro Nakamura, Takuji Ogihara, Shinichi Murai. LORES-2: A Logic Reorganization System |
| 43 | -- | 53 | Tokinori Kozawa, Hidekazu Terai. Research in Design Automation for VLSI Layout |
| 54 | -- | 60 | Shigehiro Funatsu, Masato Kawai. An Automatic Test-Generation System for Large Digital Circuits |
| 61 | -- | 73 | Nobuhiko Koike, Kenji Ohmori, Tohru Sasaki. HAL: A High-Speed Logic Simulation Machine |
| 74 | -- | 82 | Norio Kuji, Teruo Tamama, Takao Yano. A Fully-Automated Electron Beam Test System for VLSI Circuits |
| 83 | -- | 89 | Tohru Kazamaki. Milestones of New-Generation ATE |
| 112 | -- | 115 | J. Daniel Nash. New Products Design |
| 116 | -- | 117 | Conrad Zagwyn. New Products Test |
| 125 | -- | 127 | Robert E. Anderson. Book Reviews |