Journal: IEEE Design & Test of Computers

Volume 20, Issue 1

1 -- 0Rajesh Gupta. From the Editor in Chief: Twenty years!
6 -- 7Alex Orailoglu, Alexander V. Veidenbaum. Guest Editors Introduction: Application-Specific Microprocessors
8 -- 16Wolfgang Raab, Nico Brüls, J. A. Ulrich Hachmann, Jens Harnisch, Ulrich Ramacher, Christian Sauer, Axel Techmer. A 100-GOPS Programmable Processor for Vehicle Vision Systems
18 -- 25Peter Petrov, Alex Orailoglu. Application-Specific Instruction Memory Customizations for Power-Efficient Embedded Processors
26 -- 33Jong-eun Lee, Kiyoung Choi, Nikil D. Dutt. Compilation Approach for Coarse-Grained Reconfigurable Architectures
34 -- 41Oliver Wahlen, Manuel Hohenauer, Rainer Leupers, Heinrich Meyr. Instruction Scheduler Generation for Retargetable Compilation
42 -- 50Jörg E. Vollrath. Testing and Characterization of SDRAMs
51 -- 59Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski. 2D Test Sequence Generators
60 -- 67Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs
68 -- 75Jean Michel Daga, Caroline Papaix, Marc Merandat, Stephane Ricard, Giuseppe Medulla, Jeanine Guichaoua, Daniel Auvergne. Design Techniques for EEPROMs Embedded in Portable Systems on Chips
76 -- 84Luigi Carro, Marcelo Negreiros, Gabriel Parmegiani Jahn, Adão Antônio de Souza Jr., Denis Teixeira Franco. Circuit-Level Considerations for Mixed-Signal Programmable Components
86 -- 87Andrew B. Kahng. Error Tolerance
88 -- 90Carol Stolicny. ITC 2002 Panels
91 -- 92Peter J. Ashenden. Boundary Scan Test Standards
92 -- 0Ahmed Amine Jerraya. Hot Topics at HLDVT 02
93 -- 0. DATC Newsletter
94 -- 95. TTTC Newsletter
96 -- 0Frank Vahid. Making the Best of Those Extra Transistors