| 77 | -- | 78 | Rajesh Gupta. From the EIC: Past successes, future challenges |
| 79 | -- | 0 | Roy L. Russo. Serving a growing community: How D&T began |
| 80 | -- | 82 | Magdy S. Abadir, Li-C. Wang. Guest Editors Introduction: The Verification and Test of Complex Digital ICs |
| 84 | -- | 93 | Allon Adir, Eli Almog, Laurent Fournier, Eitan Marcus, Michal Rimon, Michael Vinov, Avi Ziv. Genesys-Pro: Innovations in Test Program Generation for Functional Processor Verification |
| 94 | -- | 101 | Carl Scafidi, J. Douglas Gibson, Rohit Bhatia. Validating the Itanium 2 Exception Control Unit: A Unit-Level Approach |
| 102 | -- | 109 | Fulvio Corno, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero. Automatic Test Program Generation: A Case Study |
| 111 | -- | 120 | Chia-Chih Yen, Jing-Yang Jou, Kuang-Chien Chen. A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation |
| 122 | -- | 131 | Prabhat Mishra, Nikil Dutt, Narayanan Krishnamurthy, Magdy S. Abadir. A Top-Down Methodology for Microprocessor Validation |
| 132 | -- | 143 | Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang. Safety Property Verification Using Sequential SAT and Bounded Model Checking |
| 144 | -- | 156 | Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker. ITC 2003 Roundtable: Design for Manufacturability |
| 157 | -- | 158 | Peter J. Ashenden. Policies and procedures - who needs them? |
| 159 | -- | 0 | William Mann. Southwest Test Workshop 2004 |
| 160 | -- | 163 | Carol Stolicny, Tapio Koivukangas, Rubin A. Parekhji, Ian G. Harris, Rob Aitken. ITC 2003 panels: Part 1 |
| 164 | -- | 165 | Paolo Prinetto, Alfredo Benso. Test Technology TC Newsletter |
| 166 | -- | 0 | John Willis, Andreas Kuehlmann. Design Automation TC Newsletter |
| 168 | -- | 0 | Prab Varma. Verification evolution or industrial revolution? |