| 0 | -- | 0 | Thomas W. Williams. TTTC recognizes test visionary s lifetime contribution |
| 193 | -- | 0 | Rajesh K. Gupta. The other face of design for manufacturability |
| 197 | -- | 199 | Andrew B. Kahng, Grant Martin. DAC Highlights |
| 200 | -- | 205 | Juan Antonio Carballo, Yervant Zorian, Raul Camposano, Andrzej J. Strojwas, John Kibarian, Dennis Wassung, Alex Alexanian, Steve Wigley, Neil Kelly. Guest Editors Introduction: DFM Drives Changes in Design Flow |
| 206 | -- | 213 | Alfred K. Wong. Some Thoughts on the IC Design-Manufacture Interface |
| 214 | -- | 222 | Jeng-Liang Tsai, Dong Hyun Baik, Charlie Chung-Ping Chen, Kewal K. Saluja. Yield-Driven, False-Path-Aware Clock Skew Scheduling |
| 224 | -- | 231 | Jay Jahangiri, David Abercrombie. Value-Added Defect Testing Techniques |
| 232 | -- | 239 | Greg Yeric, Ethan Cohen, John Garcia, Kurt Davis, Esam Salem, Gary Green. Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below |
| 240 | -- | 246 | Robert Madge. New test paradigms for yield and manufacturability |
| 248 | -- | 257 | Maher N. Mneimneh, Karem A. Sakallah. Principles of Sequential-Equivalence Verification |
| 258 | -- | 266 | Robert Baumann. Soft Errors in Advanced Computer Systems |
| 268 | -- | 279 | . The Future Depends on Innovation: An Interview with Irwin M. Jacobs, cofounder, chairman, and CEO of Qualcomm |
| 280 | -- | 281 | Sachin S. Sapatnekar. Empowering the designer |
| 283 | -- | 285 | Victor Berman. IEEE P1647 and P1800: Two approaches to standardization and language design |
| 286 | -- | 0 | . Design Automation Technical Committee Newsletter |
| 288 | -- | 0 | Gary Smith. Design for manufacturability comes of age |