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    Journal: IEEE Design & Test of Computers

    Volume 3, Issue 4

    15 -- 22Thirumalai Sridhar. A New Parallel Test Approach for Large Memories
    23 -- 29Teruo Tamama, Norio Kuji. Integrating an Electron-Beam System into VLSI Fault Diagnosis
    33 -- 42Dennis Petrich. Achieving Accurate Timing Measurements on TTL/CMOS Devices
    43 -- 54Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller. SMART and FAST: Test Generation for VLSI Scan-Design Circuits
    56 -- 64Jerry M. Soden, Charles F. Hawkins. Test Considerations for Gate Oxide Shorts in CMOS ICs
    72 -- 0J. Daniel Nash. New Products Design
    73 -- 75Conrad Zagwyn. New Products Test
    76 -- 77Robert E. Anderson. Book Reviews
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