External Links

    Journal: IEEE Design & Test of Computers

    Volume 3, Issue 6

    13 -- 25Hugo De Man, Jan M. Rabaey, Paul Six, Luc J. M. Claesen. Cathedral-II: A Silicon Compiler for Digital Signal Processing
    26 -- 32Frans P. M. Beenker, Karel J. E. van Eerdewijk, Robert B. W. Gerritsen, Frank N. Peacock, Max Van der Star. Macro Testing: Unifying IC and Board Test
    35 -- 41Joachim Mucha, Wilfried Daehn, Josef Gross. Self-Test in a Standard Cell Environment
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