Journal: IEEE Design & Test of Computers

Volume 33, Issue 3

4 -- 5Jörg Henkel. Robustness for 3-D Circuits - Industrial Perspectives
6 -- 7Saqib Khursheed, Pascal Vivet, Fabian Hopsch, Erik Jan Marinissen. Guest Editors' Introduction: Robust 3-D Stacked ICs
8 -- 20Eric Beyne. The 3-D Interconnect Technology Landscape
21 -- 36Perceval Coudrain, Papa Momar Souare, Rafael Prieto, Vincent Fiori, Alexis Farcy, Laurent Le-Pailleur, Jean-Philippe Colonna, Cristiano Santos, Pascal Vivet, M. Haykel Ben Jamaa, Denis Dutoit, François de Crecy, Sylvain Dumas, Christian Chancel, Didier Lattard, Séverine Cheramy. Experimental Insights Into Thermal Dissipation in TSV-Based 3-D Integrated Circuits
37 -- 45Kristof Croes, Joke De Messemaeker, Yunlong Li, Wei Guo, Olalla Varela Pedreira, Vladimir Cherman, Michele Stucchi, Ingrid De Wolf, Eric Beyne. Reliability Challenges Related to TSV Integration and 3-D Stacking
46 -- 55Frank Altmann, Matthias Petzold. Innovative Failure Analysis Techniques for 3-D Packaging Developments
56 -- 65Kaushik Roy, Byunghoo Jung, Dimitrios Peroulis, Anand Raghunathan. Integrated Systems in the More-Than-Moore Era: Designing Low-Cost Energy-Efficient Systems Using Heterogeneous Components
66 -- 76Daniela De Venuto, Valerio F. Annese, Michele Ruta, Eugenio Di Sciascio, Alberto L. Sangiovanni-Vincentelli. Designing a Cyber-Physical System for Fall Prevention by Cortico-Muscular Coupling Detection
77 -- 90Qiwu Luo, Yigang He, Yichuang Sun. Real-Time Fault Detection and Diagnosis System for Analog and Mixed-Signal Circuits of Acousto-Magnetic EAS Devices
91 -- 102Georgios Volanis, Angelos Antonopoulos, Alkis A. Hatzopoulos, Yiorgos Makris. Toward Silicon-Based Cognitive Neuromorphic ICs - A Survey
103 -- 115Debdeep Mukhopadhyay. PUFs as Promising Tools for Security in Internet of Things
116 -- 124Andrés Takach. High-Level Synthesis: Status, Trends, and Future Directions
125 -- 132Gabe Moretti. Accellera's DVCon Conferences Focus on the Community of Practicing Engineers
133 -- 134Hidetoshi Onodera. 2016 ASP-DAC
140 -- 141Theo Theocharides. Test Technology TC Newsletter
142 -- 143Mary Jane Irwin, Soha Hassoun. Steven P. Levitan (1950-2016)
144 -- 0Scott Davidson. And He Built a Crooked Chip