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    Journal: IEEE Design & Test of Computers

    Volume 5, Issue 4

    14 -- 28Xi-an Zhu, Melvin A. Breuer. Analysis of testable PLA designs
    29 -- 36Paul H. Bardell, William H. McAnney. Built-in test for RAMs
    38 -- 48Eduard Cerny, El Mostapha Aboulhamid, Guy Bois, Jocelyn Cloutier. Built-in self-test of a CMOS ALU
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