| 2 | -- | 3 | M. Ray Mercer. Guest Editorial: ITC 20th Anniversary |
| 4 | -- | 14 | Christopher W. Branson. Integrating Tester Pin Electronics |
| 15 | -- | 28 | Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater. Low-Cost Testing of High-Density Logic Components |
| 29 | -- | 40 | Richard Illman, Stephen Clarke. Built-In Self-Test of the Macrolan Chip |
| 41 | -- | 51 | Frans P. M. Beenker, Barry J. Dekker, Richard Stans, Max Van der Star. Implementing Macro Test in Silicon Compiler Design |
| 52 | -- | 63 | Benoit Nadeau-Dostie, Allan Silburt, Vinod K. Agarwal. Serial Interfacing for Embedded-Memory Testing |