| 2 | -- | 0 | . D&T News |
| 4 | -- | 0 | Kenneth D. Wagner. Guest Editorial: The Many Faces of Test |
| 5 | -- | 12 | Sandip Kundu, Sudhakar M. Reddy. Embedded Totally Self-Checking Checkers: A Practical Design |
| 13 | -- | 25 | David A. Wood, Garth A. Gibson, Randy H. Katz. Verifying a Multiprocessor Cache Controller Using Random Test Generation |
| 26 | -- | 31 | Kewal K. Saluja, Kyuchull Kim. Improved Test Generation for High-Activity Circuits |
| 32 | -- | 35 | Vishwani D. Agrawal, Hatsuyoshi Kato. Fault Sampling Revisited |
| 36 | -- | 38 | A. Ahmad, N. K. Nanda, K. Garg. Are Primitive Polynomials Always Best in Signature Analysis? |
| 39 | -- | 51 | Sakti P. Ghosh, Edward G. Grochowski. Dynamic Statistical Control of Manufacturing Test |
| 52 | -- | 65 | Jer Min Jou, Jau-Yien Lee, Yachyang Sun, Jhing-Fa Wang. An Efficient VLSI Switch-Box Router |
| 66 | -- | 72 | . A D&T Roundtable: System Test-What, Why, and How? |
| 78 | -- | 79 | . TTTC Newsletter |