External Links

    Journal: IEEE Design & Test of Computers

    Volume 9, Issue 1

    3 -- 4. News
    6 -- 7Mani Soma. Guest Editor s Introduction: Mixing Analog and Digital Systems
    8 -- 18Brian A. A. Antao, Arthur J. Brodersen. Techniques for Synthesis of Analog Integrated Circuits
    19 -- 29Alvernon Walker, Winser E. Alexander, Parag K. Lala. Fault Diagnosis in Analog Circuits Using Element Modulation
    30 -- 39Mustapha Slamani, Bozena Kaminska. Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing
    40 -- 54William R. Simpson, John W. Sheppard. System Testability Assessment for Integrated Diagnostics
    55 -- 63Don L. Millard, Karl R. Umstadter, Robert C. Block. Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway
    64 -- 71Antonio Lloy. Advanced Fault Collapsing (Logic Circuits Testing)
    72 -- 83Ashish Pancholy, Janusz Rajski, Larry J. McNaughton. Empirical Failure Analysis and Validation of Fault Models in CMOS VLSI Circuits
    95 -- 0. VLSI design
    100 -- 101. TTTC Newsletter
    102 -- 103. DATC Newsletter
    runs on