Journal: IEEE Design & Test of Computers

Volume 9, Issue 4

4 -- 5Yashwant K. Malaiya. Guest Editor s Introduction: VLSI Design 92
6 -- 13Sanjiv Narayan, Frank Vahid, Daniel D. Gajski. System Specification with the SpecCharts Language
14 -- 21Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh, Raja Venkateswaran. A Behavioral Fault Simulator for Ideal
22 -- 26Kewal K. Saluja, Chin-Foo See. An Efficient Signature Computation Method
27 -- 32Patrick Girard, Christian Landrault, Serge Pravossoudovitch. Delay-Fault Diagnosis by Critical-Path Tracing
34 -- 39Zafar Hasan, David Harrison, Maciej J. Ciesielski. A Fast Partitioning Method for PLA-Based FPGAs
40 -- 50Steven H. Kelem, Jorge P. Seidel. Shortening the Design Cycle for Programmable Logic
51 -- 60David Marple. An MPGA-Like FPGA
62 -- 65Pat McHugh. IEEE P1149.5 Module Test and Maintenance Bus
80 -- 0. 1993 Editorial Calendar
84 -- 85. DATC Newsletter
86 -- 87. TTTC Newsletter

Volume 9, Issue 3

3 -- 5Steven Trimberger. Guest Editor s Introduction: Field-Programmable Gate Arrays
7 -- 20Kuang-Chien Chen, Jason Cong, Yuzheng Ding, Andrew B. Kahng, Peter Trajmar. DAG-Map: Graph-Based FPGA Technology Mapping for Delay Optimization
21 -- 30David E. van den Bout, Joseph N. Morris, Douglas Thomae, Scott Labrozzi, Scot Wingo, Peter Hallman. AnyBoard: An FPGA-Based, Reconfigurable System
31 -- 40Mani B. Srivastava, Robert W. Brodersen. Using VHDL for High-Level, Mixed-Mode System Simulation
42 -- 53John C. Willis, Daniel P. Siewiorek. Optimizing VHDL Compilation for Parallel Simulation
54 -- 63Dominique Borrione, Robert Piloty, Dwight D. Hill, Karl J. Lieberherr, Philip Moorby. Three Decades of HDLs: Part II, Conlan Through Verilog
65 -- 78John W. Sheppard, William R. Simpson. Applying Testability Analysis for Integrated Diagnostics
79 -- 81Bulent I. Dervisoglu. Boundary-Scan Update: IEEE P1149.2 Description and Status Report
82 -- 92. A D&T Roundtable
93 -- 94. DATC Newsletter
95 -- 96. TTTC Newsletter

Volume 9, Issue 2

6 -- 7Allen Dewey. Guest Editor s Introduction: VHDL and Next-Generation Design Automation
8 -- 17Allen Dewey, Aart J. de Geus. VHDL: Toward a Unified View of Design
18 -- 32Jayanta Roy, Nand Kumar, Rajiv Dutta, Ranga Vemuri. DSS: A Distributed High-Level Synthesis System
33 -- 41Vijay Pitchumani, Pankaj Mayor, Nimish Radia. A VHDL Fault Diagnosis Tool Using Functional Fault Models
42 -- 56Dominique Borrione, Laurence V. Pierre, Ashraf M. Salem. Formal Verification of VHDL Descriptions in the Prevail Environment
58 -- 68Vijay Nagasamy, Neerav Berry, Carlos Dangelo. Specification, Planning, and Synthesis in a VHDL Design Environment
69 -- 81Yaohan Chu, Donald L. Dietmeyer, James R. Duley, Fredrick J. Hill, Mario Barbacci, Charles W. Rose, Greg Ordy, Bill Johnson, Martin Roberts. Three Decades of HDLs: Part I, CDL Through TI-HDL
82 -- 85Colin Maunder. A D&T Special Report-Boundary Scan: An End-of-Term Report-IEEE Std 1149.1 Survey Results
91 -- 93. DATC Newsletter
94 -- 95. TTTC Newsletter

Volume 9, Issue 1

3 -- 4. News
6 -- 7Mani Soma. Guest Editor s Introduction: Mixing Analog and Digital Systems
8 -- 18Brian A. A. Antao, Arthur J. Brodersen. Techniques for Synthesis of Analog Integrated Circuits
19 -- 29Alvernon Walker, Winser E. Alexander, Parag K. Lala. Fault Diagnosis in Analog Circuits Using Element Modulation
30 -- 39Mustapha Slamani, Bozena Kaminska. Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing
40 -- 54William R. Simpson, John W. Sheppard. System Testability Assessment for Integrated Diagnostics
55 -- 63Don L. Millard, Karl R. Umstadter, Robert C. Block. Noncontact Testing of Circuits Via a Laser-Induced Plasma Electrical Pathway
64 -- 71Antonio Lloy. Advanced Fault Collapsing (Logic Circuits Testing)
72 -- 83Ashish Pancholy, Janusz Rajski, Larry J. McNaughton. Empirical Failure Analysis and Validation of Fault Models in CMOS VLSI Circuits
95 -- 0. VLSI design
100 -- 101. TTTC Newsletter
102 -- 103. DATC Newsletter