| 81 | -- | 100 | Christoph Scholl, Dirk Möller, Paul Molitor, Rolf Drechsler. BDD minimization using symmetries |
| 101 | -- | 117 | Kenneth Y. Yun, David L. Dill. Automatic synthesis of extended burst-mode circuits. I.(Specification and hazard-free implementations) |
| 118 | -- | 132 | Kenneth Y. Yun, David L. Dill. Automatic synthesis of extended burst-mode circuits. II. (Automaticsynthesis) |
| 133 | -- | 141 | Zhaojun Bai, Rodney D. Slone, William T. Smith, Qiang Ye. Error bound for reduced system model by Pade approximation via the Lanczos process |
| 142 | -- | 150 | Toshiyuki Hama, Hiroaki Etoh. Topological routing path search algorithm with incremental routability test |
| 151 | -- | 162 | Witold A. Pleskacz, Charles H. Ouyang, Wojciech Maly. A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits |
| 163 | -- | 171 | Jin-Tai Yan. An improved optimal algorithm for bubble-sorting-basednon-Manhattan channel routing |
| 172 | -- | 190 | Edoardo Charbon, Ranjit Gharpurey, Robert G. Meyer, Alberto L. Sangiovanni-Vincentelli. Substrate optimization based on semi-analytical techniques |
| 191 | -- | 202 | Fulvio Corno, Uwe Gläser, Paolo Prinetto, Matteo Sonza Reorda, Heinrich Theodor Vierhaus, Massimo Violante. SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information |
| 203 | -- | 211 | Yuejian Wu, Saman Adham. Scan-based BIST fault diagnosis |
| 212 | -- | 219 | Atul Garg, Y. L. Le Coz, Hans J. Greub, R. B. Iverson, Robert F. Philhower, Pete M. Campbell, Cliff A. Maier, Sam A. Steidl, Matthew W. Ernest, Russell P. Kraft, Steven R. Carlough, J. W. Perry, Thomas W. Krawczyk Jr., John F. McDonald. Accurate high-speed performance prediction for full differential current-mode logic: the effect of dielectric anisotropy |
| 219 | -- | 230 | Dimitrios Kagaris, Spyros Tragoudas. On the design of optimal counter-based schemes for test set embedding |
| 231 | -- | 238 | How-Rern Lin, TingTing Hwang. On determining sensitization criterion in an iterative gate sizing process |
| 238 | -- | 247 | Dhiraj K. Pradhan, Mitrajit Chatterjee. GLFSR-a new test pattern generator for built-in-self-test |
| 248 | -- | 251 | Armen H. Zemanian, Victor A. Chang. Exterior templates for capacitance computations [interconnections] |