Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 30, Issue 2

165 -- 166Prashant Saxena, Yao-Wen Chang. Guest Editorial
167 -- 179Renshen Wang, Yulei Zhang, Nan-Chi Chou, Evangeline F. Y. Young, Chung-Kuan Cheng, Ronald L. Graham. Bus Matrix Synthesis Based on Steiner Graphs for Power Efficient System-on-Chip Communications
180 -- 193Michael Eick, Martin Strasser, Kun Lu, Ulf Schlichtmann, Helmut E. Graeb. Comprehensive Generation of Hierarchical Placement Rules for Analog Integrated Circuits
194 -- 204Gaurav Ajwani, Chris Chu, Wai-Kei Mak. FOARS: FLUTE Based Obstacle-Avoiding Rectilinear Steiner Tree Construction
205 -- 214Lijuan Luo, Tan Yan, Qiang Ma 0002, Martin D. F. Wong, Toshiyuki Shibuya. A New Strategy for Simultaneous Escape Based on Boundary Routing
215 -- 228Tsung-Wei Huang, Tsung-Yi Ho. A Two-Stage Integer Linear Programming-Based Droplet Routing Algorithm for Pin-Constrained Digital Microfluidic Biochips
229 -- 241Yi-Wei Lin, Malgorzata Marek-Sadowska, Wojciech Maly. On Cell Layout-Performance Relationships in VeSFET-Based, High-Density Regular Circuits
242 -- 255M. Haykel Ben Jamaa, Kartik Mohanram, Giovanni De Micheli. An Efficient Gate Library for Ambipolar CNTFET Logic
256 -- 269Vittorio Rizzoli, Diego Masotti, Franco Mastri, E. Montanari. System-Oriented Harmonic-Balance Algorithms for Circuit-Level Simulation
270 -- 283Min Gong, Hai Zhou, Li Li, Jun Tao, Xuan Zeng. Binning Optimization for Transparently-Latched Circuits
284 -- 294Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif. Simultaneous Layout Migration and Decomposition for Double Patterning Technology
295 -- 307Feng Wang 0004, Yibo Chen, Chrysostomos Nicopoulos, Xiaoxia Wu, Yuan Xie, Narayanan Vijaykrishnan. Variation-Aware Task and Communication Mapping for MPSoC Architecture
308 -- 313Tracey Y. Zhou, Hang Liu, Dian Zhou, Tuna B. Tarim. A Fast Analog Circuit Analysis Algorithm for Design Modification and Verification
313 -- 317Guo Yu, Peng Li. Hierarchical Analog/Mixed-Signal Circuit Optimization Under Process Variations and Tuning
317 -- 322Chunhua Yao, Kewal K. Saluja, Parameswaran Ramanathan. Power and Thermal Constrained Test Scheduling Under Deep Submicron Technologies