Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 31, Issue 5

649 -- 661Xin Jin, Satoshi Goto. Hilbert Transform-Based Workload Prediction and Dynamic Frequency Scaling for Power-Efficient Video Encoding
662 -- 675Lu Wan, Deming Chen. Analysis of Digital Circuit Dynamic Behavior With Timed Ternary Decision Diagrams for Better-Than-Worst-Case Design
676 -- 689Samson Melamed, Thorlindur Thorolfsson, T. Robert Harris, Shivam Priyadarshi, Paul D. Franzon, Michael B. Steer, W. Rhett Davis. Junction-Level Thermal Analysis of 3-D Integrated Circuits Using High Definition Power Blurring
690 -- 702Abde Ali Kagalwalla, Puneet Gupta, Christopher J. Progler, Steve McDonald. Design-Aware Mask Inspection
703 -- 716Shao-Yun Fang, Szu-Yu Chen, Yao-Wen Chang. Native-Conflict and Stitch-Aware Wire Perturbation for Double Patterning Technology
717 -- 725Hassan Salamy, J. Ramanujam. An Effective Solution to Task Scheduling and Memory Partitioning for Multiprocessor System-on-Chip
726 -- 739Andrew DeOrio, David Fick, Valeria Bertacco, Dennis Sylvester, David Blaauw, Jin Hu, Gregory K. Chen. A Reliable Routing Architecture and Algorithm for NoCs
740 -- 753Giovanni Mariani, Gianluca Palermo, Vittorio Zaccaria, Cristina Silvano. OSCAR: An Optimization Methodology Exploiting Spatial Correlation in Multicore Design Spaces
754 -- 764Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer. Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement
765 -- 778Hana Chockler, Daniel Kroening, Mitra Purandare. Computing Mutation Coverage in Interpolation-Based Model Checking
779 -- 789Tobias Welp, Nathan Kitchen, Andreas Kuehlmann. Hardware Acceleration for Constraint Solving for Random Simulation
790 -- 803Lingyi Liu, David Sheridan, William Tuohy, Shobha Vasudevan. A Technique for Test Coverage Closure Using GoldMine
804 -- 808Yao-Lin Jiang, Hai-Bao Chen. Application of General Orthogonal Polynomials to Fast Simulation of Nonlinear Descriptor Systems Through Piecewise-Linear Approximation
809 -- 813Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak. NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test