Journal: ACM Trans. Design Autom. Electr. Syst.

Volume 20, Issue 4

47 -- 0Hai-Bao Chen, Ying-Chi Li, Sheldon X.-D. Tan, Xin Huang, Hai Wang, Ngai Wong. H-Matrix-Based Finite-Element-Based Thermal Analysis for 3D ICs
48 -- 0Karel Heyse, Brahim Al Farisi, Karel Bruneel, Dirk Stroobandt. TCONMAP: Technology Mapping for Parameterised FPGA Configurations
49 -- 0Steffen Peter, Tony Givargis. Component-Based Synthesis of Embedded Systems Using Satisfiability Modulo Theories
50 -- 0Ali Mirtar, Sujit Dey, Anand Raghunathan. An Application Adaptation Approach to Mitigate the Impact of Dynamic Thermal Management on Video Encoding
51 -- 0Da-Wei Chang, Hsin-Hung Chen, Wei-Jian Su. VSSD: Performance Isolation in a Solid-State Drive
52 -- 0Qing Duan, Abhishek Koneru, Jun Zeng, Krishnendu Chakrabarty, Gary Dispoto. Accurate Analysis and Prediction of Enterprise Service-Level Performance
53 -- 0Ingoo Heo, Minsu Kim, Yongje Lee, Changho Choi, JinYong Lee, Brent ByungHoon Kang, Yunheung Paek. Implementing an Application-Specific Instruction-Set Processor for System-Level Dynamic Program Analysis Engines
54 -- 0Lei Jiang, Bo Zhao, Jun Yang, Youtao Zhang. Constructing Large and Fast On-Chip Cache for Mobile Processors with Multilevel Cell STT-MRAM Technology
55 -- 0Mohammad Hossein Samavatian, Mohammad Arjomand, Ramin Bashizade, Hamid Sarbazi-Azad. Architecting the Last-Level Cache for GPUs using STT-RAM Technology
56 -- 0Leandro Soares Indrusiak, James Harbin, Osmar Marchi dos Santos. Fast Simulation of Networks-on-Chip with Priority-Preemptive Arbitration
57 -- 0Irith Pomeranz. FOLD: Extreme Static Test Compaction by Folding of Functional Test Sequences
58 -- 0Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik. Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D IC
59 -- 0R. Iris Bahar, Alex K. Jones, Yuan Xie. Introduction to the Special Issue on Reliable, Resilient, and Robust Design of Circuits and Systems
60 -- 0Bradley T. Kiddie, William H. Robinson, Daniel B. Limbrick. Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods
61 -- 0Leila Delshadtehrani, Hamed Farbeh, Seyed Ghassem Miremadi. In-Scratchpad Memory Replication: Protecting Scratchpad Memories in Multicore Embedded Systems against Soft Errors
62 -- 0Nikolaos Papandreou, Thomas P. Parnell, Haralampos Pozidis, Thomas Mittelholzer, Evangelos Eleftheriou, Charles Camp, Thomas Griffin, Gary A. Tressler, Andrew Walls. Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization
63 -- 0Cong Xu, Dimin Niu, Yang Zheng, Shimeng Yu, Yuan Xie 0001. Impact of Cell Failure on Reliable Cross-Point Resistive Memory Design
64 -- 0Renyuan Zhang, Mineo Kaneko. Robust and Low-Power Digitally Programmable Delay Element Designs Employing Neuron-MOS Mechanism
65 -- 0HyungJun Kim, Siva Bhanu Krishna Boga, Arseniy Vitkovskiy, Stavros Hadjitheophanous, Paul V. Gratz, Vassos Soteriou, Maria K. Michael. Use It or Lose It: Proactive, Deterministic Longevity in Future Chip Multiprocessors
66 -- 0Andrew B. Kahng, Seokhyeong Kang, Jiajia Li, José Pineda de Gyvez. An Improved Methodology for Resilient Design Implementation