0 | -- | 0 | Rochit Rajsuman. Special Issue on Digital Hardware Testing |
261 | -- | 276 | Michael Ogbonna Esonu, Dhamin Al-Khalili, Côme Rozon. Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits |
277 | -- | 284 | Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, Sankaran M. Menon. DDQ Testing for Large ICs |
285 | -- | 298 | Michael J. Batek, John P. Hayes. Optimal Testing and Design of Adders |
299 | -- | 311 | Ben Mathew, Daniel G. Saab. Partial Reset: An Alternative DFT Approach |
313 | -- | 326 | Warren H. Debany Jr., Mark Gorniak, Anthony R. Macera, Daniel Daskiewich, Kevin A. Kwiat, Heather B. Dussault. Empirical Bounds on Fault Coverage Loss Due to LFSR Aliasing |
327 | -- | 334 | Rochit Rajsuman, Kamal Rajkanan. STD Architecture: A Practical Approach to Test M-Bits Random Access Memories |
335 | -- | 343 | Fadi Busaba, Parag K. Lala. An Approach for Self-Checking Realization of Interacting Finite State Machines |
345 | -- | 357 | Kevin T. Kornegay, Robert W. Brodersen. Integrated Test Solutions for a System Design Environment |