The following publications are possibly variants of this publication:
- A P1500 Compliant BIST-Based Approach to Embedded RAM DiagnosisDavide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda. ats 2001: 97-102 [doi]
- An industrial experience in the built-in self test of embedded RAMsPaolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina. vts 1994: 306-311 [doi]
- An effective distributed BIST architecture for RAMsMonica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto. ets 2000: 119-124 [doi]