The following publications are possibly variants of this publication:
- Enhanced IEEE 1500 test wrapper for testing small RAMs in SOCsYu-Jen Huang, Yun-Chao You, Jin-Fu Li. socc 2010: 236-240 [doi]
- IEEE 1500 Compatible Interconnect Test with Maximal Test ConcurrencyKatherine Shu-Min Li, Yi-Yu Liao, Yuo-Wen Liu, Jr-Yang Huang. ats 2009: 269-274 [doi]
- IEEE 1500 Compatible Multilevel Maximal Concurrent Interconnect TestKatherine Shu-Min Li, Yi-Yu Liao. tvlsi, 21(7):1333-1337, 2013. [doi]
- Low-Cost Self-Test Techniques for Small RAMs in SOCs Using Enhanced IEEE 1500 Test WrappersYu-Jen Huang, Jin-Fu Li. tvlsi, 20(11):2123-2127, 2012. [doi]
- IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk DetectionKatherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen. et, 23(4):341-355, 2007. [doi]