The following publications are possibly variants of this publication:
- Sequential Fault Modeling and Test Pattern Generation for CMOS Iterative Logic ArraysMihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian. TC, 49(10):1083-1099, 2000. [doi]
- Testing combinational iterative logic arrays for realistic faultsDimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis. vts 1995: 35-41 [doi]
- Testing CMOS combinational iterative logic arrays for realistic faultsDimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis. integration, 21(3):209-228, 1996. [doi]
- Robustly Testable Array Multipliers under Realistic Sequential Cell Fault ModelMihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian. vts 1998: 152-157 [doi]
- Built-in sequential fault self-testing of array multipliersMihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis. tcad, 24(3):449-460, 2005. [doi]