Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint - researchr publication authors

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Li Jiang, Qiang Xu, Krishnendu Chakrabarty, T. M. Mak. Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 191-196, IEEE, 2009. [doi]

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