Li Jiang, Qiang Xu, Krishnendu Chakrabarty, T. M. Mak. Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 191-196, IEEE, 2009. [doi]
@inproceedings{JiangXCM09,
title = {Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint},
author = {Li Jiang and Qiang Xu and Krishnendu Chakrabarty and T. M. Mak},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5361294},
tags = {optimization, layout, architecture, testing, constraints, design},
researchr = {https://researchr.org/publication/JiangXCM09},
cites = {0},
citedby = {0},
pages = {191-196},
booktitle = {2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA},
publisher = {IEEE},
}