The following publications are possibly variants of this publication:
- Multiphase BIST: a new reseeding technique for high test-data compressionEmmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos. tcad, 23(10):1429-1446, 2004. [doi]
- A New Reseeding Technique for LFSR-Based Test Pattern GenerationEmmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos. iolts 2001: 80-86 [doi]
- A highly regular multi-phase reseeding technique for scan-based BISTEmmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos. glvlsi 2003: 295-298 [doi]
- A ROMless LFSR Reseeding Scheme for Scan-based BISTEmmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos. ats 2002: 206 [doi]