Scaling and operation characteristics of HfOx based vertical RRAM for 3D cross-point architecture - researchr publication related

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J. F. Kang, B. Gao, B. Chen, P. Huang, F. F. Zhang, X. Y. Liu, H. Y. Chen, Z. Jiang, H.-S. Philip Wong, Shimeng Yu. Scaling and operation characteristics of HfOx based vertical RRAM for 3D cross-point architecture. In IEEE International Symposium on Circuits and Systemss, ISCAS 2014, Melbourne, Victoria, Australia, June 1-5, 2014. pages 417-420, IEEE, 2014. [doi]

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