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Xiao Liu, Michael S. Hsiao. On identifying functionally untestable transition faults. In Ninth IEEE International High-Level Design Validation and Test Workshop 2004, Sonoma Valley, CA, USA, November 10-12, 2004. pages 121-126, IEEE Computer Society, 2004. [doi]

The following publications are possibly variants of this publication:

Identifying Untestable Transition Faults in Latch Based Designs with Multiple ClocksManan Syal, Michael S. Hsiao, Sreejit Chakravarty. itc 2003: 1034-1043 [doi]

Efficient Implication - Based Untestable Bridge Fault IdentifierManan Syal, Michael S. Hsiao, Kiran B. Doreswamy, Sreejit Chakravarty. vts 2003: 393-402 [doi]

Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable FaultsManan Syal, Rajat Arora, Michael S. Hsiao. iccd 2005: 453-460 [doi]

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