The following publications are possibly variants of this publication:
- Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change MemoryShyue-Kung Lu, Hui-Ping Li, Kohei Miyase. iolts 2018: 226-227 [doi]
- Fault-Aware ECC Techniques for Reliability Enhancement of Flash MemoryShyue-Kung Lu, Zeng-Long Tsai, Chun-Lung Hsu, Chi-Tien Sun. vlsi-dat 2020: 1-2 [doi]
- Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash MemoriesShyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume. et, 34(5):559-570, 2018. [doi]
- Integration of Hard Repair Techniques with ECC for Enhancing Fabrication Yield and Reliability of Embedded MemoriesShyue-Kung Lu, Cheng-Ju Tsai, Masaki Hashizume. ats 2015: 49-54 [doi]
- Fault-Aware Page Address Remapping Techniques for Enhancing Yield and Reliability of Flash MemoriesShyue-Kung Lu, Shu-Chi Yu, Masaki Hashizume, Hiroyuki Yotsuyanagi. ats 2017: 254-259 [doi]