The following publications are possibly variants of this publication:
- 7.3 A 28nm embedded SG-MONOS flash macro for automotive achieving 200MHz read operation and 2.0MB/S write throughput at Ti, of 170°CYasuhiko Taito, Masaya Nakano, Hiromi Okimoto, Daisuke Okada, Takashi Ito, Takashi Kono, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi. isscc 2015: 1-3 [doi]
- 15.8 A 22nm 10.8Mb Embedded STT-MRAM Macro Achieving over 200MHz Random-Read Access and a 10.4MB/s Write Throughput with an In-Field Programmable 0.3Mb MTJ-OTP for High-End MCUsTomoya Ogawa, Ken Matsubara, Yasuhiko Taito, Tomoya Saito, Masayuki Izuna, Koichi Takeda, Yoshinobu Kaneda, Takahiro Shimoi, Hidenori Mitani, Takashi Ito, Takashi Kono. isscc 2024: 290-292 [doi]
- 40nm embedded SG-MONOS flash macros for automotive with 160MHz random access for code and endurance over 10M cycles for dataTakashi Kono, Takashi Ito, Tamaki Tsuruda, Takayuki Nishiyama, Tsutomu Nagasawa, Tomoya Ogawa, Yoshiyuki Kawashima, Hideto Hidaka, Tadaaki Yamauchi. isscc 2013: 212-213 [doi]
- 2 Density With Charge-Assisted Offset Cancellation Sense AmplifierMasaya Nakano, Yoshinobu Kaneda, Satoru Nakanishi, Yasumitsu Murai, Yosuke Tashiro, Yasuhiko Taito, Tomoya Ogawa, Hidenori Mitani, Takashi Ito, Takashi Kono. jssc, 57(10):3094-3102, 2022. [doi]
- A 28 nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macro for Automotive Achieving 6.4 GB/s Read Throughput by 200 MHz No-Wait Read Operation and 2.0 MB/s Write Throughput at Tj of 170°CYasuhiko Taito, Takashi Kono, Masaya Nakano, Tomoya Saito, Takashi Ito, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi. jssc, 51(1):213-221, 2016. [doi]
- A 24MB Embedded Flash System Based on 28nm SG-MONOS Featuring 240MHz Read Operations and Robust Over-The-Air Software Update for AutomotiveAkihiko Kanda, Takashi Kurafuji, Koichi Takeda, Tomoya Ogawa, Yasuhiko Taito, Kazuo Yoshihara, Masaya Nakano, Takashi Ito, Hiroyuki Kondo, Takashi Kono. vlsic 2019: 210 [doi]
- 40-nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macros for Automotive With 160-MHz Random Access for Code and Endurance Over 10 M Cycles for Data at the Junction Temperature of 170 $^{\circ}$CTakashi Kono, Takashi Ito, Tamaki Tsuruda, Takayuki Nishiyama, Tsutomu Nagasawa, Tomoya Ogawa, Yoshiyuki Kawashima, Hideto Hidaka, Tadaaki Yamauchi. jssc, 49(1):154-166, 2014. [doi]