The following publications are possibly variants of this publication:
- An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage SensingA. Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, V. Gouin. vts 2008: 89-94 [doi]
- Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMsA. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. vts 2007: 361-368 [doi]
- Slow write driver faults in 65nm SRAM technology: analysis and March test solutionA. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. date 2007: 528-533 [doi]