Impact of Modern Process Technologies on the Electrical Parameters of Interconnects

Debjit Sinha, Jianfeng Luo, Subramanian Rajagopalan, Shabbir H. Batterywala, Narendra V. Shenoy, Hai Zhou. Impact of Modern Process Technologies on the Electrical Parameters of Interconnects. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 875-880, IEEE Computer Society, 2007. [doi]

Abstract

Abstract is missing.