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Mehdi Baradaran Tahoori, Subhasish Mitra. Automatic Configuration Generation for FPGA Interconnect Testing. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 134-144, IEEE Computer Society, 2003. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Fault Grading FPGA Interconnect Test ConfigurationsMehdi Baradaran Tahoori, Subhasish Mitra, Shahin Toutounchi, Edward J. McCluskey. itc 2002: 608-617 [doi] Techniques and algorithms for fault grading of FPGA interconnect test configurationsMehdi Baradaran Tahoori, Subhasish Mitra. tcad, 23(2):261-272, 2004. [doi]
The following publications are possibly variants of this publication: