Masanao Yamaoka, Kazumasa Yanagisawa, Shoji Shukuri, Katsuhiro Norisue, Koichiro Ishibashi. A system LSI memory redundancy technique using an ie-flash (inverse-gate-electrode flash) programming circuit. J. Solid-State Circuits, 37(5):599-604, 2002. [doi]
Abstract is missing.