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Chong Zhao, Sujit Dey, Xiaoliang Bai. Soft-Spot Analysis: Targeting Compound Noise Effects in Nanometer Circuits. IEEE Design & Test of Computers, 22(4):362-375, 2005. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A scalable soft spot analysis methodology for compound noise effects in nano-meter circuitsChong Zhao, Xiaoliang Bai, Sujit Dey. dac 2004: 894-899 [doi] Interconnect coupling-aware driver modeling in static noise analysis for nanometer circuitsXiaoliang Bai, Rajit Chandra, Sujit Dey, P. V. Srinivas. tcad, 23(8):1256-1263, 2004. [doi]
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