Ian M. Bell - researchr alias

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Viewing Publication 1 - 14 from 14

2013

Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault ModelingLikun Xia, Muhammad Umer Farooq, Ian M. Bell, Fawnizu Azmadi Hussin, Aamir Saeed Malik. et, 29(6):861-877, 2013. [doi]

2011

Assessment of Microfluidic System Testability using Fault Simulation and Test MetricsThomas O. Myers, Ian M. Bell. et, 27(3):363-373, 2011. [doi]

2010

Automated Model Generation Algorithm for High-Level Fault ModelingLikun Xia, Ian M. Bell, Antony J. Wilkinson. tcad, 29(7):1140-1145, 2010. [doi]

2008

A novel approach for automated model generationLikun Xia, Ian M. Bell, Antony Wilkinson. iscas 2008: 504-507 [doi]

2007

The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based ApproachJ. M. Gilbert, Ian M. Bell. et, 23(4):293-307, 2007. [doi]

2004

Generation and Verification of Tests for Analog Circuits Subject to Process Parameter DeviationsStephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski. et, 20(1):11-23, 2004. [doi]

2002

Design, Manufacture and Test - Quality Test EstimationJ. M. Gilbert, Ian M. Bell, D. R. Johnson. isqed 2002: 200-205 [doi]

1998

Evaluation and comparison of structural test methodologies for analogue and mixed signal circuitsIan M. Bell, Stephen J. Spinks. icecsys 1998: 433-436 [doi]

1997

An On-Line Self-Testing Switched-Current IntegratorOsama K. Abu-Shahla, Ian M. Bell. itc 1997: 463-470

Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter DeviationsStephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski. dft 1997: 100-109 [doi]

Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptronsS. Yu, B. W. Jervis, Kevin R. Eckersall, Ian M. Bell. tcad, 16(8):930-935, 1997. [doi]

1996

Mixed current/voltage observation towards effective testing of analog and mixed-signal circuitsJosé Machado da Silva, José Silva Matos, Ian M. Bell, Gaynor E. Taylor. et, 9(1-2):75-88, 1996. [doi]

1995

Fault Orientated Test and Fault Simulation of Mixed Signal Integrated CircuitsIan M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor. iscas 1995: 389-392

Concurrent Self Test of Switched Current Circuits Based on the S:::2:::I-TechniqueGeir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell. iscas 1995: 841-844

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